![]() ![]() Field emission scanning electron microscopy (FE-SEM) indicated that the films are well grown, with compact, crack-free, and uniform deposition and a grain size of approximately 4 µm. The analysis of the X-ray diffraction (XRD) pattern indicated the formation of the pure kesterite crystal structure, and the Raman spectra showed pure CZTS with the A1 mode of vibration. Cyclic voltammetry exhibited three cathodic peaks at −0.15 V, −0.54 V, and −0.73 V, corresponding to the reduction of Cu 2+, Sn 2+, Sn 2+, and Zn 2+ metal ions, respectively. The optical, electrical, morphological, and structural properties of the CZTS thin films synthesized using different concentrations of 5 mg/mL, 10 mg/mL, 15 mg/mL, and 20 mg/mL were investigated using different techniques. Kesterite Cu 2ZnSnS 4 (CZTS) thin films using various 1,8-diiodooctane (DIO) polymer additive concentrations were fabricated by the electrochemical deposition method.
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